12th IEEE International Symposium on
Industrial Embedded Systems
14 - 16 June 2017, Toulouse, France

Program Committee & Reviewers

  • Mário Alves, Politécnico do Porto (ISEP/IPP), Portugal
  • Hakan Aydin, George Mason University, USA
  • Moris Behnam, MRTC/Mälardalen University, Sweden
  • Sanjoy Baruah , University of North Carolina, USA
  • Saddek Bensalem, VERIMAG, Grenoble, France
  • Marko Bertogna, Univerity of Modena, Italy
  • Nicola Bombieri, University of Verona, Italy
  • David Broman, KTH Royal Institute of Technology, Sweden
  • Robert Brzoza-Woch, AGH University of Science and Technology, Poland
  • Yao-Wen Chang, National Taiwan University, Taiwan
  • Marcello Coppola, STMicroelectonics, Italy
  • Philippe Coussy, Université de Bretagne Sud, France
  • Liliana Cucu-Grosjean, INRIA Paris-Rocquencourt, France
  • Abhijit Davare, Intel, USA
  • Marco Di Natale, Scuola Superiore SantAnna, Italy
  • Johan Eker, Ericsson, Sweden
  • Petru Eles, Linköpings Universitet, Sweden
  • Tullio Facchinetti, University of Pavia, Italy
  • Julien Forget, Université Lille 1, France
  • Christian Fraboul, INP ENSEEIHT, France
  • Alain Girault, INRIA, France
  • Kees Goossens, Eindhoven University of Technology, The Netherlands
  • Marcelo Götz, Federal University of Rio Grande do Sul, Brazil
  • Kim Gruettner, OFFIS, Germany
  • Zonghua Gu, Zhejiang University, PR China
  • Martin Horauer, Univ. of Applied Sciences Technikum Wien, Austria
  • Rene Krenz-Baath, Hochschule Hamm-Lippstadt, Germany
  • Marcio Kreutz, UFRN, Brazil
  • Luciano Lavango, Politecnico di Torino, Italy
  • George Lima, Federal University of Bahia, Brazil
  • Chung-Wei Lin, Toyota InfoTechnology Center, USA
  • Enrico Macii, Politecnico di Torino, Italy
  • Zoubir Mammeri, University Paul Sabatier & IRIT, France
  • Mauro Marinoni, Scuola Superiore Sant'Anna, Italy
  • Pau Marti, Technical University of Catalonia, Spain
  • Patrick Meumeu, CISTER-IPP, Portugal
  • Ahlem Mifdaoui, ISAE/DMIA, France
  • Roman Obermaisser, University of Siegen, Germany
  • Manuel Oriol, ABB Corporate Research, Switzerland
  • Claire Pagetti, ONERA, France
  • Roberto Passerone, University of Trento, Italy
  • Paulo Pedreiras, University of Aviero, Portugal
  • Stig Petersen, SINTEF, Norway
  • Luis Miguel Pinho, CISTER Research Centre/ISEP , Portugal
  • Dominik Reinhardt, BMW AG, Germany
  • Achim Rettberg, University Oldenburg, Germany
  • Luca Santinelli, ONERA, France
  • Jean-Luc Scharbarg, INP-ENSEEIHT & IRIT, France
  • Stefan Schneele, Airbus Group, Germany
  • Martin Schoeberl, Technical University of Denmark, Denmark
  • Wilfried Steiner, TTTech, Austria
  • Tomasz Szydlo, AGH-UST, Poland
  • Tullio Vardanega, University of Padua, Italy
  • Michael Wahler, ABB Corporate Research, Switzerland
  • Haibo Zeng, VirginiaTech, USA
  • Dirk Ziegenbein, Robert Bosch GmbH, Germany
  • Richard Zurawski, ISA Group, USA